| Exterior image |  |
|---|---|
| Instrument | eeeeeeeeeeeeee |
| Outline | This is a scanning electron microscope (SEM) that high resolution images for surfaces of a sample can be observed. |
| Manufacturer | Hitachi High-Tech |
| Model | SU9000 |
| Specification | "Electron gun: Field emission type Accelerating voltage: 0.5 - 30 kV Objective lens: In-lens type Secondary electron imaging resolution: 0.4 nm Maximum sample size: 9.5 mm x 5.0 mm x 3.5 mm for top-view, 6.0 mm x 5.0mm x 2.0 mm for cross-section Stage traverse: X: ±4.0 mm, Y: ±2.0 mm, Z: ±0.3 mm Tilt: Up to±40 degrees Rotation: Unavailable Energy dispersive X-ray detector (EDX): Available Other characteristics: Bright field and annular dark field scanning transmission electron misroscope (BF/ADF-STEM) images available)" |
| Room number | E108 |
| Extension number | 6161 |
| Contact details | |
| Link |
